EDAX Inc.

A Leading Provider of Innovative Materials Characterization Systems

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EDAX is a leading provider of innovative materials characterization systems encompassing Energy Dispersive Spectroscopy (EDS), Wavelength Dispersive Spectrometry (WDS), Electron Backscatter Diffraction (EBSD) and X-ray Fluorescence (XRF). The company designs, manufactures, distributes, and services hardware and software solutions for a broad range of industries, educational institutions, and research organizations.

EDAX is a unit of the Materials Analysis Division of AMETEK, Inc., which is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of approximately $5 billion.

Company Details

Address
91 McKee Drive
Mahwah, NJ 07430-2105

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Products & Services

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EDAX EDS Systems

EDAX offers three different EDS systems: The Element EDS System delivers powerful analytical capability in a compact...

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TEAM™ EDS Analysis System for SEM

The TEAM™ EDS Analysis System for the Scanning Electron Microscope (SEM) is offered with Octane Elect and Octane Elite...

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Hikari EBSD Camera Series

The Hikari EBSD Camera Series is the next generation in electron backscatter diffraction (EBSD) cameras, offering...

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Orbis Micro-XRF Elemental Analyzer

Now you can get advanced non-destructive elemental analysis with the flexibility to work across a wide range of sample...

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XLNCE SMX-BEN XRF Analyzer

The XLNCE SMX-BEN is a benchtop Energy Dispersive X-ray Fluorescence (EDXRF) analyzer that provides non-destructive,...

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News & Press Releases

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Press Release

EDAX Launches Revision of APEX™ Software for Element and Octane Elect EDS Systems EDAX Launches Latest Revision of APEX™ Software

Published: 4/4/2018
Press Release

EDAX Again Increases the Speed and Productivity of Market-Leading Electron Backscatter Diffraction Cameras

Published: 4/8/2016
Press Release

New Element Silicon Drift Detector from EDAX Delivers Power Performance in Compact Design

Published: 4/8/2016
Press Release

EDAX Launches New XLNCE Series of XRF Analyzers for Coating Thickness and Composition Analysis

Published: 4/8/2016
Press Release

EDAX Introduces the Octane Elite Series of Silicon Drift Detectors for Fast High-Quality Energy Dispersive Spectroscopy (EDS) Microscopy

Published: 4/8/2016