Orbis Micro-XRF Elemental Analyzer

Available from EDAX Inc.
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Now you can get advanced non-destructive elemental analysis with the flexibility to work across a wide range of sample types and shapes. There is minimal sample preparation. No coating is required. Orbis Micro-XRF Analyzers incorporate fast, simultaneous multi-element X-ray detection with the sensitivity to analyze from parts-per-million to 100% concentrations. Users can conduct elemental analysis on small samples, such as particles, fragments, and inclusions, or automated multi-point and imaging analysis on larger samples, with all of the benefits and simplicity of an XRF analyzer.

These benchtop instruments can measure elements from Na to Bk in either air or low-vacuum conditions. With the penetrating power of X-rays and larger spot size, Orbis analyzers are more appropriate than scanning electron microscopes for samples with larger-scale features. EDAX’s powerful, easy-to-use Vision software provides precise elemental analysis.

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