Measuring Instruments

Material Analysis with Fischerscope X-ray Fluourescence

Available from Fischer Technology, Inc.

Product Overview

Material Analysis with Fischerscope X-ray Fluourescence

FISCHERSCOPE® X-ray fluorescence instruments for coating thickness measurement and material analysis are optimally suited for determining the composition of materials, measuring thin coatings and coating systems for a wide variety of applications with and without calibration standards.

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